AFM-SPM Analyzer

Purpose

The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements.

Capabilities

• Topography imaging and analysis
• Surface roughness calculation (Ra, RMS)
• Force-distance curve analysis
• Nanoindentation and mechanical mapping
• Kelvin probe force microscopy (KPFM)
• Conductive AFM measurements

Usage Guidelines

AFM Analysis Workflow

1. Topography Analysis

   • Apply plane leveling corrections
   • Remove artifacts and noise
   • Calculate roughness parameters

2. Mechanical Mapping

   • Calibrate cantilever spring constant
   • Apply contact mechanics models
   • Generate modulus maps

3. Electrical Measurements

   • Calibrate work function reference
   • Map surface potential
   • Measure local conductivity

Process Integration

• Multi-Modal Nanomaterial Characterization Pipeline
• In-Situ Characterization Experiment Design
• Thin Film Deposition Process Optimization

Input Schema

{
  "data_file": "string",
  "analysis_type": "topography|force_curves|mechanical|electrical",
  "cantilever_specs": {
    "spring_constant": "number (N/m)",
    "tip_radius": "number (nm)"
  }
}

Output Schema

{
  "topography": {
    "Ra": "number (nm)",
    "RMS": "number (nm)",
    "Rmax": "number (nm)",
    "image_path": "string"
  },
  "mechanical": {
    "modulus": "number (GPa)",
    "adhesion": "number (nN)",
    "deformation": "number (nm)"
  },
  "electrical": {
    "surface_potential": "number (mV)",
    "work_function": "number (eV)"
  }
}