diptrace-board-bringup

SkillAI & models

RAG-backed. Plan or guide first power-on, programming, measurements, functional acceptance, and repeatable production tests for a specific DipTrace board revision. Use for assembled boards, bring-up, fixture plans, or production test procedures; «первое включение», «проверка собранной платы». Use when the user says “Plan or run bring-up for this DipTrace board.”

Available today. Use it from your connected AI after setup.

Connect ahel once, and every AI you use reads what you have installed.

Then ask your AI: use the diptrace-board-bringup skill

What this skill tells your AI

The instructions your AI receives, as published by fireostendere/mcp_diptrace in skills/diptrace-board-bringup/SKILL.md and read by ahel’s review.

Read runtime access before selecting tools or declaring a capability unavailable. MCP tools and native/headless CLI are separate interfaces.

DipTrace board bring-up and production test

RAG: engineering memory by defaultshared workflow. Use indexed measurement, circuit and bring-up material to derive the test sequence, probe strategy, limits and fault-isolation plan for this exact board.

Use the exact schematic/PCB, fitted BOM, component rules, release evidence, and firmware revision. Planning produces a procedure; a physical test passes only from actual observed measurements. Do not energize or flash hardware from a planning request.

Prepare the procedure

  1. Resolve board revision and unit/serial identity, assembly/rework state, available instruments, supply, programming interface, and requested mode: plan or guided run. Check pinouts and testpoint nets from the actual design; do not reuse another board's connector order.
  2. Read rules/ and the project specification. For every measurement define the condition/load, probe points and reference, method, expected range/tolerance, source/calculation, and stop condition.
  3. Derive supply voltage, initial current limit, rail/startup expectations, and thermal limits from this design and the instruments. Leave unknown values unresolved. Never choose a universal current limit or infer a short from a generic resistance threshold. Inspect low-resistance rails and charging capacitors in context.
  4. Plan access to power/GND, reset/boot, debug, and representative interfaces. If PCB changes are requested, use testpoint-planner and an ECO; existing connector access may suffice. Do not load sensitive RF, crystal, high-impedance, or fast nets with an unspecified probe or long stub.

First article sequence

  1. Unpowered inspection: correct parts/variant, orientation/polarity, solder bridges, connector mating, exposed pads, missing/DNP parts, and known assembly defects.
  2. With power removed, check ground and supply continuity/resistance and isolation required by the design. Account for capacitors and parallel semiconductor paths.
  3. Power from the specified current-limited source using the approved connection sequence. Observe input current, rails, sequencing, reset, and heating. Stop and remove power on a defined limit violation, unexpected heating, or abnormal behavior; record the fault before retrying.
  4. Use the exact target/programmer and verify device identity before flashing. Record firmware hash, boot configuration, programming/verification results, and logs. Mass erase, irreversible fuses, and security provisioning require their own scope. Use an installed flashing/serial tool only after discovering its actual capability.
  5. Exercise one subsystem at a time, then combined loads and interfaces. Test RF last when present. Compare measurements with the planned bounds; a missing instrument leaves that test NOT_RUN, not PASS.
  6. For failures, preserve logs and measurements, isolate the owning subsystem, and record any physical rework as an ECO through diptrace-revision-review.

Records and repeatable production test

Create/update BRINGUP.md with the procedure and append actual runs to TEST_RESULTS.csv: unit, hardware revision, firmware hash, timestamp, test/conditions, expected range, measured value/unit, result, instrument, and evidence path. Keep planned values separate from measured values.

After first-article validation, write PRODUCTION_TEST.md with fixture pin map and access, power/flash/test order, limits derived from specifications and observed validation, calibration needs, cycle time, serialization, pass/fail handling, and rework retest rules. Include environmental, EMC, reliability, or safety qualification only when applicable to the specification; bench success does not certify those categories. Fixture contact/access must be physically validated, not inferred from a CAD grid.

Return the procedure, actual results, failing or unrun tests, and the next concrete measurement. If no hardware/instruments are available, finish the plan and report that physical acceptance remains unverified.

Return the shared result; use document: null when no CAD document is involved. Record concrete artifacts and unavailable checks; a completed plan is not physical or manufacturing acceptance.

Signals

GitHub stars
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Last commit
Sep 2026
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diptrace-board-bringup
Source
github.com/fireostendere/mcp_diptrace